ONETEST 欢迎您

厂商登录 | 入驻

登录 | 注册 购物车 微信公众号
请完成安全验证

类似产品

同厂商产品

The HJPSS series is a benchtop size, high-performance, high-voltage power supply that combines space-saving and superior performance. Despite its compact width of 4.13-inch (105 mm), it can output high voltages of up to 5 kV with 。
The HIB series is a multi-channel high-voltage power supply designed specifically for demanding ion beam applications, including Focused Ion Beam (FIB) systems. This series integrates multiple power sources required for an ion bea。
The HECD series is a programmable high-voltage power supply designed specifically for electrostatic chuck (ESC) applications. It features dual-channel floating outputs with polarity switching and forced grounding capabilities. The。
  • «
  • 1

HEB Electron Beam 电源|松田精密 (在产)

The HEB series is a multi-output high-voltage power supply engineered specifically for scanning electron microscopes (SEM), e-beam lithography, and other electron gun applications. It integrates all necessary power sources-includi。

参考价格 :
产品描述
详细指标
软件和手册|白皮书
购买渠道
选件
问大家
视频
测评
口碑
系统与解决方案

Matsusada Precision Inc. · 直流电源

HEB Electron Beam 电源

Voltage;Current · Focus;Ground;+ 30 kV;50 µA · Grid;Ground;- 10 kV;50 µA
Voltage;Current
Focus;Ground;+ 30 kV;50 µA
Grid;Ground;- 10 kV;50 µA
产品定位

The HEB series is a multi-output high-voltage power supply engineered specifically for scanning electron microscopes (SEM),

e-beam lithography,

and other electron gun applications. It integrates all necessary power sources-including acceleration voltage,

filament, suppressor, extractor, and focus-into a single,

compact enclosure. Designed for high-resolution imaging and precise beam control,

the HEB series delivers ultra-low ripple and exceptional stability. The system allows for flexible configuration;

each floating output channel can be individually selected to meet specific user requirements. Additionally,

the unit supports digital control via optical fiber isolation,

ensuring safe and reliable operation in demanding research and industrial environments. Equipped with standard features like digital control via an optical fiber link and comprehensive protection circuits,

the HEB series supports both advanced control and safe operation. Backed by Matsusada Precision's renowned quality and reliability,

this power supply is the ideal partner to enhance your R&D and improve your equipment's performance.

核心参数
· :Model |Ch. Name |Reference level |Output
· :Voltage;Current
· HEB series
– Filament
– Accelerator
– +2 V, +8 V, and so on
– 3 A, 5 A
·
– Suppressor
– Accelerator
– -1 kV, -2 kV, and so on
– 50 µA, 100 µA
·
– Extractor
– Accelerator
– +5 kV, +10 kV, -10 kV and so on
– 500 µA, 3 mA and so on
·
– Focus;Accelerator;+2 kV, +5 kV, and so on;50 µA, 1000 µA and so on
·
– Accelerator
– Ground
– -10 kV, -30 kV, -60 kV and so on
– 100 µA, 700 µA and so on
· :Focus;Ground;+ 30 kV;50 µA
· :Grid;Ground;- 10 kV;50 µA
功能与特点
· Ultra-Low Ripple and High Stability: Optimized for high-resolution SEM and e-beam applications.
· Wide Acceleration Voltage Range: Standard models support -10 kV to -60 kV (up to -160 kV available upon request).
· Integrated Multi-Channel Output: Combines floating levels (Filament, Suppressor, Extractor, Focus) and ground levels (Accelerator) in one unit.
· Customizable Configuration: Floating output channels can be selected and configured to match specific system needs.
· High Stability Options: Standard temperature coefficient of 25 ppm/°C, with high-stability 10 ppm/°C models available.
· Enhanced Safety: Features fiber-optic galvanic isolation for secure remote digital control.
· Compact Design: Reduces system footprint and simplifies integration.
典型应用
· 器件供电
资源下载
· 本页仅列出核心参数,完整技术指标请见 HEB-specs.html
Matsusada Precision Inc. · onetest 仪器资源库
本文由 onetest 仪器资源库依据厂商公开资料整理,参数以厂商正式资料为准。

 

 

Matsusada Precision Inc. · 直流电源

HEB Electron Beam 电源 · 详细指标

Voltage;Current · Focus;Ground;+ 30 kV;50 µA · Grid;Ground;- 10 kV;50 µA
产品简介

The HEB series is a multi-output high-voltage power supply engineered specifically for scanning electron microscopes (SEM),

e-beam lithography,

完整技术指标
· :Model |Ch. Name |Reference level |Output
· :Voltage;Current
· HEB series
– Filament
– Accelerator
– +2 V, +8 V, and so on
– 3 A, 5 A
·
– Suppressor
– Accelerator
– -1 kV, -2 kV, and so on
– 50 µA, 100 µA
·
– Extractor
– Accelerator
– +5 kV, +10 kV, -10 kV and so on
– 500 µA, 3 mA and so on
·
– Focus;Accelerator;+2 kV, +5 kV, and so on;50 µA, 1000 µA and so on
·
– Accelerator
– Ground
– -10 kV, -30 kV, -60 kV and so on
– 100 µA, 700 µA and so on
· :Focus;Ground;+ 30 kV;50 µA
· :Grid;Ground;- 10 kV;50 µA
以上指标摘自厂商官方网站产品页/公开技术资料;厂商未标注测试条件与典型值口径的条目均按原文收录,实际以厂商正式规格书为准。
资源下载
Matsusada Precision Inc. · onetest 仪器资源库
本文由 onetest 仪器资源库依据厂商公开资料整理,参数以厂商正式资料为准。

全部

 

松田精密官方渠道


厂家联系方式

公司:Matsusada Precision Inc.(松田精密株式会社)

国际/日本:TEL +81-6-6150-5088 FAX +81-6-6150-5089

美国(北卡罗来纳):TEL (704) 496-2644 FAX (704) 496-2643


 

0条提问

X

提问

X

回答

暂无视频

 

0条口碑
X

发表口碑

口碑标题
上传图片

ONETEST仪器资源库

联系电话:+86-755-23033660

电子邮箱:info@onetest.cn

Onetest仪器资源库

公众号

Onetest仪器资源库

视频号

Onetest仪器资源库

bilibili

Onetest仪器资源库

小助手

© 2026 Onetest仪器资源库 All Rights Reserved   粤ICP备17028186号-2      粤公网安备44030902003758

AI问答